Characterization of Integrated Circuits Electromagnetic Emission with IEC 61967-4

The electromagnetic compatibility (EMC) of integrated circuits (IC) has permanently gained more and more significance during the last years. At present, ICs are moving towards operation frequencies in the GHz range with rise and fall times in the order of a few pico seconds. The high transition rates, as well as the increased complexity of ICs, lead to high electromagnetic emissions and weak susceptibility, with the result that modern electronic devices often fail to meet the EMC requirements. Therefore, EMC of ICs has to be treated as a challenging issue. New, well-suited EMC measurement methods (IEC 61967 and IEC 62132) for the characterization of EMC on chip-level enable us to perform in-depth measurements of radiated and conducted emissions and the susceptibility of ICs. In this paper the measurement results of the so-called 150 Ω method (IEC 61967-4) are compared to the results of two other methods (IEC 61967-2 and IEC 61967-6). We will see, that using the 150 Ω method, slew-rate controlled output drivers appear to have much higher emissions compared to the other methods.